Article 11120
Title of the article |
ANALYSIS OF THE APPLICABILITY OF THICKNESS MEASUREMENT METHODS DIELECTRIC LAYERS IN CONTROLLED SYNTHESIS PROTECTIVE COATINGS BY MICRO-ARC METHOD OXYGENATING |
Authors |
Golubkov Pavel Evgen’evich, postgraduate student, engineer, sub-department of information-measuring equipment and metrology, Penza State University (40 Krasnaya street, Penza, Russia), E-mail: golpavpnz@yandex.ru |
Index UDK |
62-791.2 |
DOI |
10.21685/2307-5538-2020-1-11 |
Abstract |
Background. The object of the study is methods for measuring the thickness of oxide coatings on metal non-ferromagnetic substrates. The subject of the study is the essence and metrological characteristics (measurement range, errors) of existing methods for measuring the thickness of oxide coatings on metal non-ferromagnetic substrates. The purpose of this work is to select a method for measuring the thickness of oxide layers for continuous measurement and control of the thickness of protective coatings obtained by micro-arc oxidation (MAO) during their controlled synthesis. |
Key words |
micro-arc oxidation, thickness measurement methods, measurement range, error, automated controlled synthesis |
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Дата обновления: 07.05.2020 17:02