THE RESEARCH OF THE RELIABILITY OF ELECTRONIC PRODUCTS UNDER THE INFLUENCE OF IONIZING RADIATION 

Ishkov Anton Sergeevich, candidate of technical sciences, associate professor, sub-department of radio engineering and electronic systems, Penza State University (40 Krasnaya street, Penza, Russia), E-mail: ishkovanton@mail.ru
Petrov Aleksandr Sergeevich, candidate of technical sciences, head of department of radiation tests, Scientific Research Institute of Devices (building 8, industrial zone Turayevo, Lytkarino, Moscow region, Russia), E-mail: as_petrov@inbox.ru
Solodimova Galina Anatol'evna, candidate of technical sciences, associate professor, sub-department of information-measuring technique and metrology, Penza State University (40 Krasnaya street, Penza, Russia), E-mail: solodimova@mail.ru
Egorov Denis Vladimirovich, head of department of reliability and testing, Scientific Research Institute of Electro-mechanical Devices (44 Karakozova street, Penza, Russia), E-mail: edv.egorov@ya.ru 

629.78.023 

10.21685/2307-5538-2020-1-5 

Background. The object of study are resistors that are widely used in equipment, which in the course of its work can be exposed to various types of radiation. The subject of the study is the radiation tests of resistors to determine their ability to preserve the values of the parameters-criteria of validity within specified standards in the process and (or) after radiation exposure. The aim of the work is to develop effective methods for conducting radiation tests of resistors.
Materials and methods. To conduct research on the radiation resistance of resistors, an experimental method was used based on the use of modeling facilities representing radiation sources that have a single or close physical nature and characteristics with radiation factors acting on the resistors in real operating conditions.
Results. A circuit is proposed for measuring the resistance of resistors when exposed to radiation. Typical waveforms of changes in the resistance of resistors in the process of exposure to gamma radiation are obtained.
Conclusions. Data on the presence of a sharp reversible decrease in the resistance of resistors during and immediately after ionizing radiation are obtained. The factors affecting the time of the loss of operability of the resistors and the degree of decrease in resistance during radiation exposure are determined. 

resistors, reliability, testing, resistance, ionizing radiation, radiation resistance