Article 6218
Title of the article |
CONTROLLED SYNTHESIS OF THIN FILMS OBTAINED BY MAGNETRON SPUTTERING TECHNIQUE |
Authors |
Utkin Kirill Eduardovich, deputy chief of the microelectronics department, Scietific-research Institute of Physical Measurement (8/10 Volodarskogo street, Penza, Russia), niifi@sura.ru |
Index UDK |
621.793.7 |
DOI |
10.21685/2307-5538-2018-2-6 |
Abstract |
Background. Recently the magnetron sputtering technique providing controlled thin-layers sputtering with the required parameters has been rapidly developing. When a target is used multiple times a zone of erosion (groove) is formed on it having a direct impact on material sputtering rate (film thickness). Reduction of thin film thickness causes the electrical resistivity increase, i.e. non-repeatability of the required response and parameters. The work objective is sputtering of thin films with the required parameters and response by means of long-term or multiple use target. |
Key words |
metal-film pressure sensors, thin film synthesis, grooving while thin-film sputtering, magnetron sputtering technique, groove (erosion), target, film thickness, time of thin-film sputtering |
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Дата обновления: 01.10.2018 09:37