“Measuring. Monitoring. Management. Control” №2, 2019 Contents
Author | Title of the article | Pages... |
INFORMATION-MEASURING AND CONTROL SYSTEMS | ||
A. K. Grishko |
Markov model for predicting the parametric reliability of electronic systems |
5-12 |
V.Ya.Goryachev,T.Yu.Brostilova, |
13-21 |
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DEVICES AND METHODS OF MEASURING |
|
A. V. Perov |
22-29 |
|
M. S. Revunov |
Equalization of the image to improve cross-correlation measurement method |
30-37 |
S. V. Abramov, N. S. Ul'yanin |
38-44 |
|
S.N.Medvedeva,V.I.Chernetsov, |
Display typical structures of measurement circuits in the structure of the generalized signal graphs |
45-55 |
V. V. Kikot, I. N. Cheburakhin, |
56-63 |
|
K. V. Gudkov, K. Yu. Piskaev, |
Simulation modeling for components of data-measuring systems for fluid flow control |
64-75 |
О. Е. Bezborodova, O. N. Bodin, V. G. Polosin, A. G. Ubiennykh |
76-84 |
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TECHNOLOGY INSTRUMENTATION |
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E. A. Pecherskaya, P. E. Golubkov, |
The algorithm of functioning of the intellectual system synthesis of oxide coatings |
85-93 |
V. E. Pautkin |
Physical and chemical bases of the anode compound of microelectromechanical systems elements |
94-98 |
E. A. Pecherskaya, P. E. Golubkov, |
Intellectual system of controlled synthesis of oxide coatings |
99-107 |
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Дата обновления: 18.07.2019 14:47